X-ray Fluorescence (XRF): XRF is a non-destructive analytical technique that uses X-rays to excite atoms in a sample, causing them to emit characteristic X-rays. This method is ideal for analyzing the elemental composition of metals and alloys, providing rapid results with minimal sample preparation.
Inductively Coupled Plasma Mass Spectrometry (ICP-MS): ICP-MS is a highly sensitive technique that ionizes samples in a high-temperature plasma and measures the mass-to-charge ratio of ions. This method is particularly useful for detecting trace elements in high-purity materials, offering unparalleled sensitivity and accuracy.
Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES): ICP-OES measures the emission of light from excited atoms in a plasma, allowing for the simultaneous detection of multiple elements. This technique is widely used for quality control and impurity analysis in various industries due to its speed and accuracy.