Ellipsometry Analysis Service

Ellipsometry is a sophisticated optical technique that has gained significant traction in the field of material science, particularly for the analysis of thin films and surfaces. This non-destructive method measures the change in the polarization state of light upon reflection from a sample, providing valuable insights into the sample's physical and optical properties.

Principles of Ellipsometry Analysis

From a scientific perspective, ellipsometry operates on the principle that linearly polarized light becomes elliptically polarized upon interaction with a surface or thin film at an oblique angle. The state of polarization is altered due to the complex dielectric function of the material, which is influenced by its electronic structure. The key parameters measured in ellipsometry are Psi (Ψ) and Delta (Δ), which describe the rotation and ellipticity of the polarized light, respectively. These parameters are then correlated with the material's refractive index, thickness, and other properties through mathematical models and physical equations.

The interaction of light with the sample can be described by the Fresnel equations, which take into account the reflection and transmission of light at the interface between different media. Advanced models, such as the T-matrix method or the finite-difference time-domain (FDTD) method, are employed to interpret the ellipsometric data for complex structures and anisotropic materials.

Advantages of Ellipsometry Analysis

• Non-destructive and Non-invasive: Ellipsometry allows for the analysis of samples without causing any damage, which is crucial for delicate environmental materials.
• High Sensitivity: It can detect changes in thickness and optical properties at the nanometer scale, making it ideal for thin film analysis.
• Broadband Spectrum Analysis: Spectroscopic ellipsometry uses a wide range of wavelengths, providing comprehensive data on material properties across different energy regimes.
• Real-time Monitoring: The technique enables real-time analysis, which is beneficial for process control in environmental material development.
• Versatility: Ellipsometry can be applied to a wide variety of materials, including transparent and translucent films, semiconductors, polymers, and biological coatings.

Our Services

At CD BioSciences, we pride ourselves on offering a state-of-the-art ellipsometry analysis service tailored to the needs of environment-friendly materials analysis. Our service is designed to support researchers and industries in the development and quality control of sustainable materials.

Methods of Ellipsometry Analysis

We employ various ellipsometry techniques to meet the diverse needs of our clients, including:

Sample Requirements

Our service accommodates a wide range of sample types, including but not limited to:

Thin Films

Transparent or semitransparent films with thicknesses ranging from 1 nm to 1,000 nm.

Semiconductors

Materials used in the production of sustainable electronics.

Polymers

Biodegradable polymers for packaging and other applications.

Biological Coatings

Films used in medical and environmental applications.

Our Workflow

Why Choose Us?

• High-Quality Data: We provide accurate and reliable data that can be used for both research and industrial applications.
• Competitive Pricing: Our services are offered at competitive rates, making advanced material analysis accessible to a broader range of clients.
• Customized Solutions: We work closely with our clients to understand their specific needs and provide customized solutions for their environment-friendly materials analysis.

If you are interested in our services, please contact us for more information.

Our products and services are for research use only and cannot be used for any clinical purposes.